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Proceedings Paper

Weapon system interoperability testing between target acquisition systems and missile guidance sections utilizing adjacent hardware-in-the loop sensor test facilities
Author(s): Kenneth G. LeSueur; Eddie Burroughs Jr.; Richard M. Robinson
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Paper Abstract

Laboratory Test and Evaluation of imaging infrared (I2R) systems is being greatly enhanced through the use of the Electro-Optics Sensor Flight Evaluation Laboratory (EOSFEL) and the Electro-Optics Target Acquisition Sensor Evaluation Laboratory (EOTASEL) at the US Army Redstone Technical Test Center. In addition to other standard and future test support, these laboratories will be utilized to support tactical I2R missile system interoperability testing. The EOSFEL is a state-of-the-art, performance grade, Hardware-In-the-Loop test capability for in-band, closed- loop test and evaluation of optically guided missile seekers, guidance sections, and control sections. The EOTASEL is a class 100,000 clean room laboratory, with state-of-the-art test capability for evaluating the performance of electro-optical target acquisition and fire control subsystems in a hardware/human-in-the-loop environment. With I2R missile systems being developed to work with electro-optical target acquisition subsystems, such as the second generation Forward Looking Infrared sights, the need arises for testing the interoperability of these sensor subsystems within the cost effective confines of the laboratory. Interoperability testing today is currently performed at the system level in real-world field environments, which is very expensive and costly to identify problems at this level. This paper describes a realistic technique for performing high fidelity laboratory interoperability testing which utilizes the EOSFEL and EOTASEL including two Dynamic Infrared Scene Projector systems, a five-axis flight motion simulator, a two-axis platform motion simulator, climatic chambers, supporting instrumentation, and computer control.

Paper Details

Date Published: 15 July 1997
PDF: 12 pages
Proc. SPIE 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II, (15 July 1997); doi: 10.1117/12.280962
Show Author Affiliations
Kenneth G. LeSueur, U.S. Army Test and Evaluation Command (United States)
Eddie Burroughs Jr., U.S. Army Test and Evaluation Command (United States)
Richard M. Robinson, Amtec Corp. (United States)

Published in SPIE Proceedings Vol. 3084:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II
Robert Lee Murrer Jr., Editor(s)

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