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Proceedings Paper

Rendering energy-conservative scenes in real time
Author(s): Eric M. Olson; Dennis L. Garbo; Dennis R. Crow; Charles F. Coker
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Paper Abstract

Real-time infrared (IR) scene generation from HardWare-in- the-Loop (HWIL) testing of IR seeker systems is a complex problem due to the required frame rates and image fidelity. High frame rates are required for current generation seeker systems to perform designation, discrimination, identification, tracking, and aimpoint selection tasks. Computational requirements for IR signature phenomenology and sensor effects have been difficult to perform in real- time to support HWIL testing. Commercial scene generation hardware is rapidly improving and is becoming a viable solution for HWIL testing activities being conducted at the Kinetic Kill Vehicle Hardware-in-the-Loop Simulator facility at Eglin AFB, Florida. This paper presents computational techniques performed to overcome IR scene rendering errors incurred with commercially available hardware and software for real-time scene generation in support of HWIL testing. These techniques provide an acceptable solution to real-time IR scene generation that strikes a balance between physical accuracy and image framing rates. The results of these techniques are investigated as they pertain to rendering accuracy and speed for target objects which begin as a point source during acquisition and develop into an extended source representation during aimpoint selection.

Paper Details

Date Published: 15 July 1997
PDF: 10 pages
Proc. SPIE 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II, (15 July 1997); doi: 10.1117/12.280954
Show Author Affiliations
Eric M. Olson, Science Applications International Corp. (United States)
Dennis L. Garbo, Science Applications International Corp. (United States)
Dennis R. Crow, Kinetics, Inc. (United States)
Charles F. Coker, Air Force Wright Lab. (United States)

Published in SPIE Proceedings Vol. 3084:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II
Robert Lee Murrer Jr., Editor(s)

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