
Proceedings Paper
Growth issues of CdZnTe crystals doped with transition elements for photorefractive applicationsFormat | Member Price | Non-Member Price |
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Paper Abstract
A way to interconnect optical fibers in a telecommunication network working between 1.3 and 1.55 micrometer is the use of two-wave mixing mirrors. These devices use the photorefractive effect which can be described as a modification of the refractive index under an electric field created by electric charges photo-induced and then trapped in the material. The index modulation reproduces then the image projected on the material. Due to its high electro-optic factor of merit, about three times higher than the one of III-V semiconductors, and its photosensitivity in the telecommunication wavelength range, CdTe doped with transition elements is very attractive. CdTe crystals dedicated to such devices have to obey severe criteria that are shown to guide their crystal growth. Several effects are discussed, such as solubility, segregation, precipitation, purity, not only related to the transition elements incorporated in CdTe, but also to zinc which is shown to present a specific behavior in photorefractive CdTe. The stoichiometry of the crystals is shown to be a significant parameter as well: from electrical measurements on CdZnTe crystals presenting various V doping levels, an effective segregation coefficient depending on stoichiometry and purity is introduced. The deviation from stoichiometry of CdTe is estimated from lattice parameter measurements. Finally the appropriateness, for the specific application of photorefractivity, of the different techniques of crystal growth classically used for CdTe is discussed.
Paper Details
Date Published: 14 July 1997
PDF: 9 pages
Proc. SPIE 3178, Solid State Crystals: Growth and Characterization, (14 July 1997); doi: 10.1117/12.280725
Published in SPIE Proceedings Vol. 3178:
Solid State Crystals: Growth and Characterization
Jozef Zmija; Andrzej Majchrowski; Jaroslaw Rutkowski; Jerzy Zielinski, Editor(s)
PDF: 9 pages
Proc. SPIE 3178, Solid State Crystals: Growth and Characterization, (14 July 1997); doi: 10.1117/12.280725
Show Author Affiliations
Robert Triboulet, Lab. de Physique des Solides de Bellevue (France)
Edouard Rzepka, Lab. de Physique des Solides de Bellevue (France)
A. Aoudia, Lab. de Physique des Solides de Bellevue (France)
Edouard Rzepka, Lab. de Physique des Solides de Bellevue (France)
A. Aoudia, Lab. de Physique des Solides de Bellevue (France)
Gilles Martel, France Telecom (France)
Jean-Yves Moisan, France Telecom (France)
Jean-Yves Moisan, France Telecom (France)
Published in SPIE Proceedings Vol. 3178:
Solid State Crystals: Growth and Characterization
Jozef Zmija; Andrzej Majchrowski; Jaroslaw Rutkowski; Jerzy Zielinski, Editor(s)
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