Share Email Print

Proceedings Paper

AEDC direct-write scene generation test capabilities
Author(s): Heard S. Lowry III; Parker David Elrod; Rick J. Johnson
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A scene generation capability is under development at the Arnold Engineering Development Center (AEDC) for visible and lR focal plane array (FPA) testing that uses two-axis acousto-optic (AO) deflectors. A multifrequency RF input creates a rake of output beams which is step-scanned across the face of the imaging device. Each component of the rake is modulated independently, and the beams are blanked during the shift from one row of pixels to the next. The expected maximum frame rate is 20 kHz, with operation synchronized to the operation of the FPA. A modular concept is being investigated to address large (51 2 x 512 pixel) FPAs. This AEDC Direct Write Scene Generation (DW5G) technology is being applied toward development of a transportable and a fixed-site Scene Generation Test Capability (SGTC).

Paper Details

Date Published: 1 February 1991
PDF: 12 pages
Proc. SPIE 1454, Beam Deflection and Scanning Technologies, (1 February 1991); doi: 10.1117/12.28044
Show Author Affiliations
Heard S. Lowry III, Arvin/Calspan Corp. (United States)
Parker David Elrod, Alvin/Calspan Corp. (United States)
Rick J. Johnson, Alvin/Calspan Corp. (United States)

Published in SPIE Proceedings Vol. 1454:
Beam Deflection and Scanning Technologies
Leo Beiser; Gerald F. Marshall, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?