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Proceedings Paper

Coordinate measuring system for 2-D scanners
Author(s): Vladimir V. Bukatin
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Paper Abstract

This paper investigates one of the possible designs of an optical-electronic system for identification of optical measuring signal parameters as a two-dimensional interference picture with spatial selection.

Paper Details

Date Published: 1 February 1991
PDF: 6 pages
Proc. SPIE 1454, Beam Deflection and Scanning Technologies, (1 February 1991); doi: 10.1117/12.28039
Show Author Affiliations
Vladimir V. Bukatin, Institute of Engineering Cybernetics (Belarus)

Published in SPIE Proceedings Vol. 1454:
Beam Deflection and Scanning Technologies
Leo Beiser; Gerald F. Marshall, Editor(s)

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