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Proceedings Paper

Technologies of high-performance thermography systems
Author(s): Rainer Breiter; Wolfgang A. Cabanski; Karl-Heinz Mauk; R. Koch; Werner Rode
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Paper Abstract

A family of 2 dimensional detection modules based on 256 by 256 and 486 by 640 platinum silicide (PtSi) focal planes, or 128 by 128 and 256 by 256 mercury cadmium telluride (MCT) focal planes for applications in either the 3 - 5 micrometer (MWIR) or 8 - 10 micrometer (LWIR) range was recently developed by AIM. A wide variety of applications is covered by the specific features unique for these two material systems. The PtSi units provide state of the art correctability with long term stable gain and offset coefficients. The MCT units provide extremely fast frame rates like 400 Hz with snapshot integration times as short as 250 microseconds and with a thermal resolution NETD less than 20 mK for e.g. the 128 by 128 LWIR module. The unique design idea general for all of these modules is the exclusively digital interface, using 14 bit analog to digital conversion to provide state of the art correctability, access to highly dynamic scenes without any loss of information and simplified exchangeability of the units. Device specific features like bias voltages etc. are identified during the final test and stored in a memory on the driving electronics. This concept allows an easy exchange of IDCAs of the same type without any need for tuning or e.g. the possibility to upgrade a PtSi based unit to an MCT module by just loading the suitable software. Miniaturized digital signal processor (DSP) based image correction units were developed for testing and operating the units with output data rates of up to 16 Mpixels/s. These boards provide the ability for freely programmable realtime functions like two point correction and various data manipulations in thermography applications.

Paper Details

Date Published: 13 August 1997
PDF: 9 pages
Proc. SPIE 3061, Infrared Technology and Applications XXIII, (13 August 1997); doi: 10.1117/12.280312
Show Author Affiliations
Rainer Breiter, AEG Infrarot-Module GmbH (Germany)
Wolfgang A. Cabanski, AEG Infrarot-Module GmbH (Germany)
Karl-Heinz Mauk, AEG Infrarot-Module GmbH (Germany)
R. Koch, AEG Infrarot-Module GmbH (Germany)
Werner Rode, AEG Infrarot-Module GmbH (Germany)


Published in SPIE Proceedings Vol. 3061:
Infrared Technology and Applications XXIII
Bjorn F. Andresen; Marija Strojnik, Editor(s)

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