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Proceedings Paper

Bone structure as revealed by microtomography
Author(s): Tor Hildebrand; Andres Laib; Dieter Ulrich; Adrian Kohlbrenner; Peter Ruegsegger
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Paper Abstract

The appearance of cancellous bone architecture is different for various skeletal sites and various disease states. In the iliac crest it is more plate-like, whereas in the spine rods dominate. During aging and disease plates are perforated and connecting rods are dissolved. There is a continuous shift from one structural type to the other. So traditional histomorphometric procedures, which are based on a fixed model type, will lead to questionable results. 3D microtomography allows to assess model independent structural parameters so that trabecular thickness, for example, can be determined directly. Not only mean thicknesses are available but also thickness histograms which are helpful to identify pathological states. Other features such as trabecular separation, degree of anisotropy and structural type index can be extracted from the 3D images and allow to characterize cancellous bone and its changes due to aging, disease and treatment. To fully exploit the significance of bone structure on bone strength large scale finite element (FE) analyses are performed. Hence microtomography, performed with a sufficiently fine isotropic spatial resolution, reveals information on the structural features of cancellous bone which were not available so far and which will, hopefully, lead to a better understanding of the pathogenesis of bone diseases and subsequently to improved treatment regimes.

Paper Details

Date Published: 24 October 1997
PDF: 10 pages
Proc. SPIE 3149, Developments in X-Ray Tomography, (24 October 1997);
Show Author Affiliations
Tor Hildebrand, Univ. Zuerich and Swiss Federal Institute of Technology (Switzerland)
Andres Laib, Univ. Zuerich and Swiss Federal Institute of Technology (Switzerland)
Dieter Ulrich, Univ. Zuerich and Swiss Federal Institute of Technology (Switzerland)
Adrian Kohlbrenner, Univ. Zuerich and Swiss Federal Institute of Technology (Switzerland)
Peter Ruegsegger, Univ. Zuerich and Swiss Federal Institute of Technology (Switzerland)

Published in SPIE Proceedings Vol. 3149:
Developments in X-Ray Tomography
Ulrich Bonse, Editor(s)

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