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Proceedings Paper

Electro-optic spatial light modulator characterization using Mueller matrix imaging
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Paper Abstract

A series of electro-optic spatial light modulators have been measured with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analytes the existing polarized state over a spatially resolved image of the sample. Images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in a device with lead- lanthanum-zirconate-titanate modulating material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2 X 10-16 (m/V)2 was determined in the modulator active regions.

Paper Details

Date Published: 3 October 1997
PDF: 6 pages
Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); doi: 10.1117/12.278966
Show Author Affiliations
Elizabeth A. Sornsin, Univ. of Alabama in Huntsville (United States)
Russell A. Chipman, Univ. of Alabama in Huntsville (United States)

Published in SPIE Proceedings Vol. 3121:
Polarization: Measurement, Analysis, and Remote Sensing
Dennis H. Goldstein; Russell A. Chipman, Editor(s)

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