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Proceedings Paper

Evaluation of Russian-grown Cd0.8Zn0.2Te
Author(s): Michael M. Schieber; Haim Hermon; Ralph B. James; James C. Lund; Arlyn J. Antolak; Daniel H. Morse; Nikolai N. Kolesnikov; Y. N. Ivanov; Mark S. Goorsky; H. Yoon; James E. Toney; Tuviah E. Schlesinger
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Paper Abstract

More recent Russian grown single crystals of Cd0.8Zn0.2Te (CZT) were evaluated using proton induced x ray emission (PIXE), x ray diffraction (XRD), photoluminescence (PL), infra red (IR) transmission microscopy, leakage current measurements and response to nuclear radiation. Whereas in the past the Russian grown samples were not acceptable for gamma ray detectors application, the present samples had a somewhat better crystallinity and a higher resistivity, and did even show distinct photopeaks for an 241Am spectrum. Differences in the material properties between various Russian (n- and p-type) and U.S. (n-type) CZT are described.

Paper Details

Date Published: 7 July 1997
PDF: 6 pages
Proc. SPIE 3115, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications, (7 July 1997); doi: 10.1117/12.277699
Show Author Affiliations
Michael M. Schieber, Sandia National Labs. and Hebrew Univ. of Jerusalem (Israel)
Haim Hermon, Sandia National Labs. (Israel)
Ralph B. James, Sandia National Labs. (United States)
James C. Lund, Sandia National Labs. (United States)
Arlyn J. Antolak, Sandia National Labs. (United States)
Daniel H. Morse, Sandia National Labs. (United States)
Nikolai N. Kolesnikov, Institute of Solid State Physics (Russia)
Y. N. Ivanov, Institute of Solid State Physics (Russia)
Mark S. Goorsky, Univ. of California/Los Angeles (United States)
H. Yoon, Univ. of California/Los Angeles (United States)
James E. Toney, Carnegie Mellon Univ. (United States)
Tuviah E. Schlesinger, Carnegie Mellon Univ. (United States)

Published in SPIE Proceedings Vol. 3115:
Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications
Richard B. Hoover; F. Patrick Doty, Editor(s)

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