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Proceedings Paper

Sensor and detection algorithm-based clutter metrics
Author(s): John W. Hilgers; William P. Vockel; William R. Reynolds; J. Warren Pickard
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Paper Abstract

Clutter metrics are important image measures for evaluating the expected performance of sensors and detection algorithms. Typically, clutter metrics attempt to measure the degree to which background objects resemble targets. That is, the more target-like objects or attributes in the background the higher the clutter level. However, it is critically important that the characteristics of the sensor systems and the detection algorithms be included in any measure of clutter. For example, clutter to a coarse resolution sensor coupled with a pulse thresholding detection algorithm is not necessarily clutter to a second generation FLIR with a man in the loop. Using present state- of-the-art first and second order clutter metrics and respective performance studies, a new class of sensor/algorithm clutter metrics will be derived which explicitly use characteristics of the sensor and detection algorithms. A methodology will be presented for deriving sensor/algorithm dependent clutter metric coefficients and algorithms for a broad class of systems.

Paper Details

Date Published: 20 June 1997
PDF: 11 pages
Proc. SPIE 3062, Targets and Backgrounds: Characterization and Representation III, (20 June 1997); doi: 10.1117/12.276685
Show Author Affiliations
John W. Hilgers, Signature Research, Inc. (United States)
William P. Vockel, Signature Research, Inc. (United States)
William R. Reynolds, Signature Research, Inc. (United States)
J. Warren Pickard, Nichols Research Corp. (United States)

Published in SPIE Proceedings Vol. 3062:
Targets and Backgrounds: Characterization and Representation III
Wendell R. Watkins; Dieter Clement, Editor(s)

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