
Proceedings Paper
Optical device positioning by using Becke linesFormat | Member Price | Non-Member Price |
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Paper Abstract
A new passive-alignment technique using Becke lines is proposed for assembling optical devices. Optical devices with
a waveguide structure, such as planar lightwave circuits and laser diodes, have a core or active layer whose refractive index is
slightly higher than that of the surrounding area. The Becke lines are diffractive stripes appearing at the boundary between
materials having different refractive indices such as cores and the surroundings. For low-loss optical connection between the
devices, their cores must be precisely aligned with each other. In our technique, the optical devices are aligned by observing the
Becke lines located on both edges of the core, which make it possible to determine the exact core position. With this technique,
optical devices can be precisely aligned without using the thin metal-film markers used for conventional passive alignment. The
position of an optical waveguide was experimentally aligned by illuminating it with infrared (IR) light, obseving the Becke
lines with video system and moving it with motor-driven stages. The positioning uncertainty was less than 0.2 tm, which is the
same as the resolution of the video system used. This technique is thus practical for precisely assembling optical devices.
Paper Details
Date Published: 17 July 1996
PDF: 8 pages
Proc. SPIE 2860, Laser Interferometry VIII: Techniques and Analysis, (17 July 1996); doi: 10.1117/12.276316
Published in SPIE Proceedings Vol. 2860:
Laser Interferometry VIII: Techniques and Analysis
Malgorzata Kujawinska; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)
PDF: 8 pages
Proc. SPIE 2860, Laser Interferometry VIII: Techniques and Analysis, (17 July 1996); doi: 10.1117/12.276316
Show Author Affiliations
Tetsufumi Shoji, NTT Interdisciplinary Research Labs. (Japan)
Fusao Shimokawa, NTT Interdisciplinary Research Labs. (Japan)
Fusao Shimokawa, NTT Interdisciplinary Research Labs. (Japan)
Yasuhide Nishida, NTT Interdisciplinary Research Labs. (Japan)
Published in SPIE Proceedings Vol. 2860:
Laser Interferometry VIII: Techniques and Analysis
Malgorzata Kujawinska; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)
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