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Proceedings Paper

Modified in-plane electronic speckle pattern shearing interferometry (ESPSI)
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Paper Abstract

Two optical methods for obtaining the partial derivatives of in-plane and out-of-plane displacement fields in the in-plane ESPSI configuration using temporal phase stepping for automatic analysis of fringe patterns are described. In the first method lateral shear interferograms of object image fields generated by individual symmetrical illuminating beams are recorded independently. The phases are calculated and their subtraction/addition gives required in-plane/out-of-plane displacement derivatives, respectively. Phase stepping is readily performed in the setup based on fiber optics and modulated laser diode illumination. In the second method two primary interferograms: a conventional in-plane displacement ESPI recording and one with object images mutually laterally displaced are recorded. Similarly, software subtraction or addition is performed to separate the out-of-plane displacement derivatives and double sensitivity in-plane displacement information.

Paper Details

Date Published: 17 July 1996
PDF: 7 pages
Proc. SPIE 2860, Laser Interferometry VIII: Techniques and Analysis, (17 July 1996); doi: 10.1117/12.276312
Show Author Affiliations
Krzysztof Patorski, Warsaw Univ. of Technology (Poland)
Artur G. Olszak, Warsaw Univ. of Technology (United States)

Published in SPIE Proceedings Vol. 2860:
Laser Interferometry VIII: Techniques and Analysis
Malgorzata Kujawinska; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)

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