
Proceedings Paper
Digital shearography for pure in-plane strain measurement on the object surface under three-dimensional strain conditionsFormat | Member Price | Non-Member Price |
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Paper Abstract
Digital shearography is a coherent optical method in conjunction with the digital image processing. It allows the
shearogram, which depicts directly displacement derivatives, in real time to be observed. Thus, it is suited well for
nondestructive testing. However, its application for strain measurement has not been widely adopted in industry, because the
shearogram includes usually both the in-plane strain, e.g. c3u/ox, and the out-of-plane component, e.g. 5w/ox. Although the
out-of-plane component can be separated from the shearogram by manipulating the illumination, the pure in-plane strain
component can be never determined exactly by adjusting the illumination angle. This paper presents the principle of
shearography with two independent illuminating directions (usually the same but mutual illuminations) for the pure in-plane
strain measurement. The shearograms for each illuminating direction are generated by applying the phase shifting
technique. Thus, the phase maps of the two shearograms corresponding the two illuminating directions can be obtained. The
result by subtracting the phase maps of the two shearograms yields a new fringe pattern depicting the pure in-plane strain
component. The experimental procedure and its applications for determining pure in-plane strains are presented.
Paper Details
Date Published: 17 July 1996
PDF: 9 pages
Proc. SPIE 2860, Laser Interferometry VIII: Techniques and Analysis, (17 July 1996); doi: 10.1117/12.276304
Published in SPIE Proceedings Vol. 2860:
Laser Interferometry VIII: Techniques and Analysis
Malgorzata Kujawinska; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)
PDF: 9 pages
Proc. SPIE 2860, Laser Interferometry VIII: Techniques and Analysis, (17 July 1996); doi: 10.1117/12.276304
Show Author Affiliations
Gerhard Kupfer, Univ. Kassel (Germany)
Published in SPIE Proceedings Vol. 2860:
Laser Interferometry VIII: Techniques and Analysis
Malgorzata Kujawinska; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)
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