Optical methods equipped with phase measuring methods of fringe pattern analysis have become recently an important tool in non-destructive testing, remote shape measurement and strain analysis. However they are usually vulnerable to improper settings of operational parameters, algorithm selection, data evaluafion sequence and often require highly qualified operator. These disadvantages may be reduced by implementing smart fringe image processing system, SFIPS, which is equipped in image quality evaluation modules and feed-back and feed-forward decision loops. The paper presents the architecture of SFIPS and the principles of formation and usage of image feature vectors at sequential stages of processing. Example of implementing the SFIPS for analysis of crossed fringe pattern obtained in grating interferometry system is given. Key words: smart fringe pattern processing system, automatic fringe pattern analysis, image feature vector, phase measuring methods, image quality evaluation.

Date Published: 17 July 1996
PDF: 10 pages
Proc. SPIE 2860, Laser Interferometry VIII: Techniques and Analysis, (17 July 1996); doi: 10.1117/12.276303

Published in SPIE Proceedings Vol. 2860:
Laser Interferometry VIII: Techniques and Analysis
Malgorzata Kujawinska; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)