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Proceedings Paper

Measurement of shape and vibration using a single electronic speckle interferometry configuration
Author(s): Fang Chen; Christopher T. Griffen; Thomas E. Allen; Gordon M. Brown
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Paper Abstract

Shape and vibration measurements of structures are required in many automotive product development and manufacturing processes. Optical measurement methods are attractive because they do not require contact with the structure and offer high precision and accuracy. Nevertheless optical techniques also suffer from a number of limitations which prohibit wide application. Typically the object is viewed and illuminated from two different points making objects situated in confined areas difficult to measure. In addition, most optical techniques are not easily scaleable in measurement range. Finally, most shape measurement techniques cannot measure vibration without a change in configuration. This paper presents a single electronic speckle interferometry (ESPI) method to measure both surface shape and vibration. A two-wavelength approach is used to measure shape and a stepped strobed phase technique is employed to measure vibration amplitude and phase. The technique requires only one line of sight to the object and can be scaled to measure surface roughness as well as large surface contours. The technique features the ability to coincidentally measure shape and dynamic behavior for structural design, modification, and optimization. The theory of the technique along with results of an experiment are presented.

Paper Details

Date Published: 17 July 1996
PDF: 12 pages
Proc. SPIE 2860, Laser Interferometry VIII: Techniques and Analysis, (17 July 1996); doi: 10.1117/12.276301
Show Author Affiliations
Fang Chen, Ford Motor Co. (United States)
Christopher T. Griffen, Ford Motor Co. (United States)
Thomas E. Allen, Ford Research Lab. (United States)
Gordon M. Brown, Optical Systems Engineering (United States)

Published in SPIE Proceedings Vol. 2860:
Laser Interferometry VIII: Techniques and Analysis
Malgorzata Kujawinska; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)

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