The common technique of dielectric (epsilon) (t) measurements involves the application of a polarization invariant electric field to a capacitor filled with the material under study and the detection of the temporal evolution of the resulting current or charge flow. The counterpart condition of applying a given dielectric displacement and monitoring the electric field relates to the dielectric modulus M(t) with M((omega) ). Isothermal and thermally stimulated experimental techniques for directly accessing the relaxation M(t) are outlined and discussed as regards their relation to the dielectric retardation (epsilon) (t) and to dc-conductivity(sigma) _dc. We also address several microscopic processes which are inherently linked to the dielectric modulus through their common feature of displaying a redistribution of charge.

Date Published: 13 June 1997
PDF: 10 pages
Proc. SPIE 3181, Dielectric and Related Phenomena: Materials Physico-Chemistry, Spectrometric Investigations, and Applications, (13 June 1997); doi: 10.1117/12.276276

Published in SPIE Proceedings Vol. 3181:
Dielectric and Related Phenomena: Materials Physico-Chemistry, Spectrometric Investigations, and Applications
Andrzej Wlochowicz, Editor(s)