The method of thermally stimulate currents (TSC) is applied for electrical studies of thin film metal/insulator/metal (MIM) structures which include thin films of rare earth metal oxides (TFREMO). These structures were fabricated by vacuum deposition of MIM sandwiches on the basis of sesquioxides of ytterbium, holmium or dysprosium. The TSC thermograms for M/TFREMO/M thermoelectrects obtained at different measurement conditions were very similar. Only a single peak located at temperatures 380K-410K was observed in the experimental thermograms for the temperature range 297K-500K. The nature of the TSC peak for the examined oxides seems to be very similar. The TSC response is connected with trapping centers in TFREMO situated at energy depth of about 0.5 eV-0.7 eV.

Date Published: 13 June 1997
PDF: 4 pages
Proc. SPIE 3181, Dielectric and Related Phenomena: Materials Physico-Chemistry, Spectrometric Investigations, and Applications, (13 June 1997); doi: 10.1117/12.276256

Published in SPIE Proceedings Vol. 3181:
Dielectric and Related Phenomena: Materials Physico-Chemistry, Spectrometric Investigations, and Applications
Andrzej Wlochowicz, Editor(s)