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Proceedings Paper

Experimental study of physical parameters of semiconductor lasers
Author(s): Gleb E. Shtengel; Paul A. Morton; Rudolf F. Kazarinov; David A. Ackerman; Mark S. Hybertsen; Gregory L. Belenky; C. Lewis Reynolds Jr.
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Paper Abstract

We discuss various experimental methods for measurements of the optical gain, transparency wavelength and optical loss. We discuss existing methods as well as newly developed. It is also shown how this set of measurements allows for characterization of other laser parameters, such as linewidth enhancement factor, differential gain, and wavelength chirp. We illustrate how these techniques are used for improving the laser performance for different applications.

Paper Details

Date Published: 6 June 1997
PDF: 12 pages
Proc. SPIE 2994, Physics and Simulation of Optoelectronic Devices V, (6 June 1997); doi: 10.1117/12.275618
Show Author Affiliations
Gleb E. Shtengel, Lucent Technologies Bell Labs. (United States)
Paul A. Morton, Lucent Technologies Bell Labs. (United States)
Rudolf F. Kazarinov, Lucent Technologies Bell Labs. (United States)
David A. Ackerman, Lucent Technologies Bell Labs. (United States)
Mark S. Hybertsen, Lucent Technologies Bell Labs. (United States)
Gregory L. Belenky, Lucent Technologies Bell Labs. and SUNY/Stony Brook (United States)
C. Lewis Reynolds Jr., Lucent Technologies Bell Labs. (United States)


Published in SPIE Proceedings Vol. 2994:
Physics and Simulation of Optoelectronic Devices V
Marek Osinski; Weng W. Chow, Editor(s)

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