Share Email Print

Proceedings Paper

Geometrical optical modeling considerations for LCD projector display systems
Author(s): John Charles Schweyen; Kevin J. Garcia; Philip L. Gleckman
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

End-to-end modeling of the photometric performance of LCD projection system using Monte Carlo geometrical ray tracing methods is an accurate and precise tool for predicting and improving the performance of these deices before, during and after product development. However, an accurate simulation first requires considering which physical properties contribute most to the system's photometric performance. Second, these properties must be characterized by physical measurements and translated into the tangible modeling parameters of a ray tracing program. Third, the implications of using a Monte Carlo ray tracing algorithm, and in general any other optical transformation algorithm, on radiometric accuracy must be well understood. These considerations as well as a generalized approach to the characterization and simulation of an LCD projector are described. A commercially available ray tracing program, the Advanced Systems Analysis Program, is used to demonstrate this approach. The irradiance uniformity, CIE color performance and screen brightness of an arc source LCD projector system are computed as an example.

Paper Details

Date Published: 8 May 1997
PDF: 15 pages
Proc. SPIE 3013, Projection Displays III, (8 May 1997); doi: 10.1117/12.273865
Show Author Affiliations
John Charles Schweyen, Breault Research Organization, Inc. (United States)
Kevin J. Garcia, Breault Research Organization, Inc. (United States)
Philip L. Gleckman, InFocus Systems, Inc. (United States)

Published in SPIE Proceedings Vol. 3013:
Projection Displays III
Ming Hsien Wu, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?