Share Email Print

Proceedings Paper

Measurement-based depth of focus
Author(s): Stephanie L. Ellenberger; Ian T. Young
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

An important point in the automated evaluation of molecular cytogenetic preparations is focusing the specimen before taking images. The in-focus position can vary for different positions on the slide, thus every new field of view has to be refocused. Another problem is that objects in one field of view can lie in different planes with the effect that one object is out-of-focus while the other one is in-focus. We want to investigate the importance of focus with regard to measurements like object intensity. Diffraction wave theory leads to a formula, which can be used to determine the depth-of-focus (DOF), the tolerance in the in-focus position where the image is still sharp. However practice shows that it is possible to get good measurement results even if the specimen is not imaged perfectly.the relation between the theoretical and practical DOF is analyzed. The objects under investigation are either 2D or 3D and are imaged in absorption and fluorescence mode. It appears that the DOF based on measurements can be 5 to 10 times bigger than a DOF based on wave theory with only little loss of accuracy.

Paper Details

Date Published: 2 May 1997
PDF: 9 pages
Proc. SPIE 2982, Optical Diagnostics of Biological Fluids and Advanced Techniques in Analytical Cytology, (2 May 1997); doi: 10.1117/12.273648
Show Author Affiliations
Stephanie L. Ellenberger, Delft Univ. of Technology (Netherlands)
Ian T. Young, Delft Univ. of Technology (Netherlands)

Published in SPIE Proceedings Vol. 2982:
Optical Diagnostics of Biological Fluids and Advanced Techniques in Analytical Cytology
Robert C. Leif; Alexander V. Priezzhev; Toshimitsu Asakura; Robert C. Leif, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?