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Proceedings Paper

Design of a time-resolved electron microscope
Author(s): Shuhong Li; Hanben Niu
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Paper Abstract

The idea of time-resolved electron microscope, which is composed of a thermal emission electron gun, focusing lenses, object lens, intermediate lens, projector lens, scanning deflector, multi-compensation deflectors, fiber plate based phosphor screen and image intensifier, based on an integration of transmission electron microscope and picosecond framing techniques has been proposed. The design methods, including the calculation of magnetic field, dynamic electric-magnetic field, electron trajectory tracing and spatial and temporal spread functions, are also involved. The operation mode of this time-resolved electron microscope, in order to obtain microscopic framing images for the studied object, are discussed. Finally, this paper shows the design results and concluded that 6 framing images with the size of (Phi) 10 mm, temporal resolution of 100 ps and spatial resolution of 100 angstroms can be achievable by this design.

Paper Details

Date Published: 28 May 1997
PDF: 7 pages
Proc. SPIE 2869, 22nd International Congress on High-Speed Photography and Photonics, (28 May 1997); doi: 10.1117/12.273349
Show Author Affiliations
Shuhong Li, Xi'an Institute of Optics and Precision Mechanics (China)
Hanben Niu, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 2869:
22nd International Congress on High-Speed Photography and Photonics
Dennis L. Paisley; ALan M. Frank, Editor(s)

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