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Proceedings Paper

Polarization interference metrology for statistical parameters of optical fields
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Paper Abstract

Polarization interference metrology of the optical fields' transverse correlation function and its amplitude and phase statistical moments are discussed. Examples of application of such a metrology to the problem of surface roughness diagnostics are also presented.

Paper Details

Date Published: 1 April 1997
PDF: 9 pages
Proc. SPIE 3094, Polarimetry and Ellipsometry, (1 April 1997); doi: 10.1117/12.271837
Show Author Affiliations
Oleg V. Angelsky, Chernivtsy State Univ. (Ukraine)
Peter P. Maksimyak, Chernivtsy State Univ. (Ukraine)

Published in SPIE Proceedings Vol. 3094:
Polarimetry and Ellipsometry
Maksymilian Pluta; Tomasz R. Wolinski, Editor(s)

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