Share Email Print

Proceedings Paper

Atomic force microscopy using small cantilevers
Author(s): Deron A. Walters; Mario Viani; George T. Paloczi; Tilman E. Schaeffer; Jason P. Cleveland; Mark A. Wendman; Gus Gurley; Virgil B. Elings; Paul K. Hansma
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We have applied a new generation of short cantilevers with high resonant frequencies to tapping mode atomic force microscopy of a process in situ. Crystal growth in the presence of protein has been imaged stably at 79 lines/s (1.6 s/image), using a 26 micrometers long cantilever with a spring constant of 0.66 N/m at a tapping frequency of 90.9 kHz. This high scan speed nearly eliminated distortion in the step edge motion and allowed imaging of finer features along the step edges. Atomic force microscopy with short cantilevers therefore allows higher resolution imaging of crystal growth in space as well as time.

Paper Details

Date Published: 15 April 1997
PDF: 5 pages
Proc. SPIE 3009, Micromachining and Imaging, (15 April 1997); doi: 10.1117/12.271227
Show Author Affiliations
Deron A. Walters, Univ. of California/Santa Barbara (United States)
Mario Viani, Univ. of California/Santa Barbara (United States)
George T. Paloczi, Univ. of California/Santa Barbara (United States)
Tilman E. Schaeffer, Univ. of California/Santa Barbara (United States)
Jason P. Cleveland, Digital Instruments, Inc. (United States)
Mark A. Wendman, Digital Instruments, Inc. (United States)
Gus Gurley, Digital Instruments, Inc. (United States)
Virgil B. Elings, Digital Instruments, Inc. (United States)
Paul K. Hansma, Univ. of California/Santa Barbara (United States)

Published in SPIE Proceedings Vol. 3009:
Micromachining and Imaging
Terry A. Michalske; Mark A. Wendman, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?