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Proceedings Paper

Effects of interface electronics on the performance of VCSEL-based optical interconnect systems
Author(s): R. K. Kostuck; Andreas C. Cangellaris; Robert R. Boye
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Paper Abstract

The performance of optical interconnects is directly related to the characteristics of the electronic interface between the optical interconnect components and the electronic processing elements. In this paper we examine this issue and determine limits on the power and bandwidth of optical interconnects with low threshold VCSEL sources. For a 0.8 micrometers CMOS process the effects of coupling parasitics and detector capacitance limit signal bandwidth below 500 MHz. The effects of device geometry, fanout, and line length are also studied and show that with existing optoelectronic devices optical interconnects are competitive with electrical connections at the board level, but not below this packaging level.

Paper Details

Date Published: 4 April 1997
PDF: 10 pages
Proc. SPIE 3005, Optoelectronic Interconnects and Packaging IV, (4 April 1997); doi: 10.1117/12.271075
Show Author Affiliations
R. K. Kostuck, Univ. of Arizona (United States)
Andreas C. Cangellaris, Univ. of Arizona (United States)
Robert R. Boye, Univ. of Arizona (United States)

Published in SPIE Proceedings Vol. 3005:
Optoelectronic Interconnects and Packaging IV
Ray T. Chen; Peter S. Guilfoyle, Editor(s)

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