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Proceedings Paper

Comparative studies of metal cutting with high power lasers
Author(s): J. Xie; Aravinda Kar; James A. Rothenflue; W. Pete Latham
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Paper Abstract

The most widely used high power industrial lasers are Nd:YAG and carbon-dioxide lasers. Chemical oxygen iodine laser (COIL), whose wavelength (1.315 micrometer) is between that of YAG (1.06 micrometer) and carbon-dioxide (10.6 micrometer) lasers, is another high power laser for industrial applications. The cutting capability of these lasers is investigated. The cut depth depends strongly on the absorptivity of materials, kerf width and cutting speed. Absorptivity is an unknown parameter for which experimental data at high temperatures are unavailable. Theoretical values of the absorptivities of various metals are obtained using Hagen-Ruben's relation. It is found that the absorptivity of metals is linearly proportional to the square root of resistivity and inversely proportional to the square root of the wavelength. The absorptivities of COIL ad YAG lasers are 2.84 and 3.16 times larger than that of carbon-dioxide laser, respectively. Based on the theoretical values of absorptivity, the cut depth of metals are analyzed for various laser powers, cutting speeds for these lasers. Due to the wavelength dependence of absorptivity, the cut depths for COIL and YAG lasers are expected to be 2.84 and 3.16 times deeper than that for carbon-dioxide laser.

Paper Details

Date Published: 4 April 1997
PDF: 4 pages
Proc. SPIE 3092, XI International Symposium on Gas Flow and Chemical Lasers and High-Power Laser Conference, (4 April 1997); doi: 10.1117/12.270183
Show Author Affiliations
J. Xie, Univ. of Central Florida (United States)
Aravinda Kar, CREOL/Univ. of Central Florida (United States)
James A. Rothenflue, Air Force Phillips Lab. (United States)
W. Pete Latham, Air Force Phillips Lab. (United States)

Published in SPIE Proceedings Vol. 3092:
XI International Symposium on Gas Flow and Chemical Lasers and High-Power Laser Conference
Denis R. Hall; Howard J. Baker, Editor(s)

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