Share Email Print
cover

Proceedings Paper

Multilevel optical memory with ellipsometry-based readout method
Author(s): Vasyliy G. Kravets; Vladislav I. Zimenko; V. I. Indutny; Vasily V. Motuz; N. E. Yanchyk
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The aim of the present study is an investigation of ellipsometry based reading out method from multilevel optical recording medium. This method is based on the variation of ellipsometrical parameters of laser beam under reflection from the multilayered (or multilevel) recording medium. A mathematical simulation of the above mentioned recording medium was performed and the program for calculation of ellipsometrical parameters variation was developed under reflection from multilayered information carrier. The calculations for As2 Se3-As2S3 pairs of materials and a correspondent sample of four- layered information carrier were performed.

Paper Details

Date Published: 28 February 1997
PDF: 6 pages
Proc. SPIE 3055, International Conference on Optical Storage, Imaging, and Transmission of Information, (28 February 1997); doi: 10.1117/12.267705
Show Author Affiliations
Vasyliy G. Kravets, Institute of Information Recording Problems (Ukraine)
Vladislav I. Zimenko, Institute of Information Recording Problems (Ukraine)
V. I. Indutny, Institute of Information Recording Problems (Ukraine)
Vasily V. Motuz, Institute of Information Recording Problems (Ukraine)
N. E. Yanchyk, Institute of Information Recording Problems (Ukraine)


Published in SPIE Proceedings Vol. 3055:
International Conference on Optical Storage, Imaging, and Transmission of Information
Viacheslav V. Petrov; Sergei V. Svechnikov, Editor(s)

© SPIE. Terms of Use
Back to Top