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Proceedings Paper

Mechanism for recording and erasing optical information by laser radiation on an SiO2-(Co+Si)-SiO2-Si multilayer structure
Author(s): Arthur Medvids; Maris Knite; J. Kaupuzs; V. Frishfelds
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Paper Abstract

We present in this paper results of investigation of optical properties of SiO2-(Co plus Si)-SiO2-Si structures under laser treatment with Q-switched YAG:Nd and carbon dioxide lasers. The photo-thermo-chemical reaction of Co with Si has a threshold character. No changes in optical properties of (Co plus Si) mixture was observed up to intensities of carbon dioxide laser radiation 2 MW/cm2. At larger intensities the reflection coefficient R decreases from 70% to 45% with increasing of the intensity up to 8 MW/cm2. When this multilayer structure is irradiated with Q-switched YAG:Nd laser with radiation intensity from 14 MW/cm2 to 53 MW/cm2, the magnitude of reflection coefficient returns to its initial value 70%. It means that the information recorded by carbon-dioxide laser is erased. Calculations of the temperature field during irradiation with carbon-dioxide and YAG:Nd laser showed that the phase transition from mixture (Co plus Si) to CoSi2 caused by irradiation with carbon-dioxide laser results in recording of information, whereas the thermal impact caused by irradiation with YAG:Nd laser results in amorphization of CoSi2 and erasing of information.

Paper Details

Date Published: 28 February 1997
PDF: 9 pages
Proc. SPIE 3055, International Conference on Optical Storage, Imaging, and Transmission of Information, (28 February 1997); doi: 10.1117/12.267686
Show Author Affiliations
Arthur Medvids, Riga Technical Univ. (Latvia)
Maris Knite, Riga Technical Univ. (Latvia)
J. Kaupuzs, Riga Technical Univ. (Latvia)
V. Frishfelds, Riga Technical Univ. (Latvia)

Published in SPIE Proceedings Vol. 3055:
International Conference on Optical Storage, Imaging, and Transmission of Information
Viacheslav V. Petrov; Sergei V. Svechnikov, Editor(s)

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