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Proceedings Paper

Toward a metric for patterned injury analysis
Author(s): William R. Oliver; Daniel S. Fritsch
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Paper Abstract

An intriguing question in the matching of objects with patterned injures in two and three dimensions is that of an appropriate metric for closeness -- is it possible to objectively measure how well an object 'fits' a patterned injury. Many investigators have suggested an energy-based metric, and have used such metrics to analyze craniofacial growth and anatomic variation. A strict dependence on homology is the primary disadvantage of this energy functional for generalized biological structures; many shapes do not have obvious landmarks. Some tentative solutions to the problem of landmark dependency for patterned injury analysis are presented. One intriguing approach comes from recent work in axiomatic vision. This approach has resulted in the development of a multiresolution medial axis for the extraction of shape primitives which can be used as the basis for registration. A scale-based description of this process can be captured in structures called cores, which can describe object shape and position in a highly compact manner. Cores may provide a scale- and shape-based method of determining correspondences necessary for determining the number and position of landmarks for some patterned injuries. Each of the approaches described are generalizable to higher dimensions, and can thus be used to analyze both two- and three- dimensional data. Together, they may represent a reasonable way of measuring shape distance for the purpose of matching objects and wounds, and can be combined with texture measures for a complete description.

Paper Details

Date Published: 19 February 1997
PDF: 12 pages
Proc. SPIE 2942, Investigative Image Processing, (19 February 1997);
Show Author Affiliations
William R. Oliver, Armed Forces Institute of Pathology (United States)
Daniel S. Fritsch, Univ. of North Carolina/Chapel Hill (United States)


Published in SPIE Proceedings Vol. 2942:
Investigative Image Processing
Leonid I. Rudin; Simon K. Bramble, Editor(s)

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