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Proceedings Paper

Microhologram recording in amorphous semiconductor films
Author(s): Andris O. Ozols; Girts Ivanovs; Maris Laudobelis
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Paper Abstract

The effect of holographic grating (HG) size on their diffraction efficiency (DE) at different spatial frequencies is experimentally studied in amorphous AS-S-Se films. The HG size was changed by focusing the recording beams. It is found that reduction of the size from 1100 micrometer to 150 micrometer increases the maximal DE from 0.9% to 1.8%. Further reduction down to 20 micrometer decreases the maximal DE down to 0.08%. DE at lower spatial frequencies is attenuated more than at higher ones. The observed effects are explained by the nonuniformity of thin HG recorded by Gaussian beams as well as by the curvature of the focused wavefronts and peculiarities of the recording mechanism in As-S-Se films. It is concluded that minimization of hologram size in AS-S-Se films is feasible only down to 150 micrometers.

Paper Details

Date Published: 6 February 1997
PDF: 4 pages
Proc. SPIE 2968, Optical Organic and Semiconductor Inorganic Materials, (6 February 1997); doi: 10.1117/12.266854
Show Author Affiliations
Andris O. Ozols, Technical Univ. of Riga (Latvia)
Girts Ivanovs, Technical Univ. of Riga (Latvia)
Maris Laudobelis, Technical Univ. of Riga (Latvia)

Published in SPIE Proceedings Vol. 2968:
Optical Organic and Semiconductor Inorganic Materials
Edgar A. Silinsh; Arthur Medvids; Andrejs R. Lusis; Andris O. Ozols, Editor(s)

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