Share Email Print

Proceedings Paper

Functional models of electrochromic devices: cycling capacity and degradation
Author(s): Andrejs R. Lusis
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Electrical transfer and diffusion of ions and the irreversibility of ion and electron processes in heterojunctions are responsible for degradation of ionic devices. These processes for electrochromic devices (ECD) determine the cycling capacity and lifetime. The basic problem here is how to match the electrochemical parameters (including chemical potential) of heterojunction. The experiments had been carried out on ECD based on system: (phi) -<ITO/WO3//AAH//IrO2/ITO>-(phi) , where AAH is solid electrolyte based on antimony acid hydrates. The cycling capacity and degradation processes of ECD are investigated by electro-optical and electro-chemical spectroscopy. The analysis of experimental data are based on assumption that electrode reactions changed composition of electrode and electrolyte materials and surface layers as well as constitution of heterojunction's interface. The conclusions of these investigations and problem analyses are some considerations about electrochemical battery model and cycling capacity of ECD. That depends on reversibility of solid state reactions on the electrode and ion insertion processes and phase stability of electrode and electrolyte materials. The ions of sublattices of immobile ions of solid phases and other components of these phases have to be stable against chemical interactions, diffusion and transfer of mobile ion during cycling.

Paper Details

Date Published: 6 February 1997
PDF: 7 pages
Proc. SPIE 2968, Optical Organic and Semiconductor Inorganic Materials, (6 February 1997); doi: 10.1117/12.266828
Show Author Affiliations
Andrejs R. Lusis, Univ. of Latvia (Latvia)

Published in SPIE Proceedings Vol. 2968:
Optical Organic and Semiconductor Inorganic Materials
Edgar A. Silinsh; Arthur Medvids; Andrejs R. Lusis; Andris O. Ozols, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?