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Proceedings Paper

Performance data of optically stimulable irradiated materials (doped alkali halides) oriented for imaging and dosimetry purposes
Author(s): Aija Tale; Irena Plavina; A. Kalnins; Anatoli I. Popov
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Paper Abstract

Performance characteristics of a doped alkali halide (KBr:In)-based imaging plate (IP) and dosemeter (D) both the devices utilizing optically stimulated luminescence (OSL) and suitable for UV-light and x-ray energy recording are described. By exploiting (silicon) photodiode array as a photodetector, the detective quantum efficiency of 0.1 for IP (KBr:In) can be achieved. A very wide dynamic range, 1010:1 for UV (6.35 eV) and 1011:1 for x-ray (44 kV tube voltage) OSL recording at the spatial resolution of 1 mm2, is favorable for digital imaging and considerably improves image quality. These possibilities are illustrated by presenting available information capacities, energy consumption per bit as a function of the spatial resolution, and signal contrast ratio as a function of the input energy if using the KBr:In material with optimum characteristics (the activator concentration of 1017 cm-3, the 245 nm UV-light sensitization of UV detecting, minimum concentration of Ca+2 ions, etc.). Both the radiation dose storage is stable only up to 18 degrees Celsius and 200 s after an x-bremsstrahlung write at this temperature. When used for dose measuring, KBr-In monocrystals can be exploited for low-intensity x-ray detection and provide a possibility of the space background measuring in a second time interval.

Paper Details

Date Published: 4 February 1997
PDF: 6 pages
Proc. SPIE 2967, Optical Inorganic Dielectric Materials and Devices, (4 February 1997); doi: 10.1117/12.266512
Show Author Affiliations
Aija Tale, Univ. of Latvia (Latvia)
Irena Plavina, Univ. of Latvia (Latvia)
A. Kalnins, Univ. of Latvia (Latvia)
Anatoli I. Popov, Univ. of Latvia (Latvia)

Published in SPIE Proceedings Vol. 2967:
Optical Inorganic Dielectric Materials and Devices
Andris Krumins; Donats K. Millers; Andris R. Sternberg; Janis Spigulis, Editor(s)

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