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Proceedings Paper

Wavelength detector using monolithically integrated subwavelength metal-semiconductor-metal photodetectors
Author(s): Erli Chen; Stephen Y. Chou
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Paper Abstract

A novel wavelength detector with a large spectral response range has been realized by monolithically integrating two metal-semiconductor-metal photodetectors that have finger spacings less than the wavelength of the incident light. The operating principle of the detector is based on the one-to- one correspondence between the photocurrent ratio of the photodetectors and the wavelength of the incident light, caused by the resonance effect of the photodetectors' subwavelength-spaced fingers. The experiment shows that the device has a wavelength resolution of 5 nm in the spectral range of 450 - 800 nm.

Paper Details

Date Published: 22 January 1997
PDF: 7 pages
Proc. SPIE 3006, Optoelectronic Integrated Circuits, (22 January 1997); doi: 10.1117/12.264254
Show Author Affiliations
Erli Chen, Univ. of Minnesota/Twin Cities (United States)
Stephen Y. Chou, Univ. of Minnesota/Twin Cities (United States)

Published in SPIE Proceedings Vol. 3006:
Optoelectronic Integrated Circuits
Yoon-Soo Park; Ramu V. Ramaswamy, Editor(s)

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