
Proceedings Paper
SAR image target location analysis based on strong scattering pointFormat | Member Price | Non-Member Price |
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Paper Abstract
The location of three-dimensional coordinates of the target is a very important research in the fields of radar, electronic countermeasures and wireless communication. It plays an extremely important role in the drawing of topographic maps, environmental monitoring, disaster prevention and modern warfare. At present, there are problems that the location method is complex and the location accuracy is not high. Aiming at this, this paper proposes a method to locate the strong scattering point by using SAR image, which is combined with the range Doppler model to locate the target. Analytical solutions are derived from the theory of equations and the error factors are analyzed and discussed. Finally, an experiment was carried out to locate the five corner reflector targets with strong scattering characteristics using synthetic aperture radar, and the three-dimensional coordinates of the strong scattering point targets were obtained. The experimental results demonstrate the reliability of the method.
Paper Details
Date Published: 13 May 2022
PDF: 7 pages
Proc. SPIE 12248, Second International Conference on Sensors and Information Technology (ICSI 2022), 1224816 (13 May 2022); doi: 10.1117/12.2637527
Published in SPIE Proceedings Vol. 12248:
Second International Conference on Sensors and Information Technology (ICSI 2022)
Lijia Pan, Editor(s)
PDF: 7 pages
Proc. SPIE 12248, Second International Conference on Sensors and Information Technology (ICSI 2022), 1224816 (13 May 2022); doi: 10.1117/12.2637527
Show Author Affiliations
Congjie Zheng, Sun Yat-sen University (China)
Shuya Chen, Sun Yat-sen University (China)
Yuhao Lu, Sun Yat-sen University (China)
Shuya Chen, Sun Yat-sen University (China)
Yuhao Lu, Sun Yat-sen University (China)
Qihong Dan, Sun Yat-sen University (China)
Qingsong Wang, Sun Yat-sen University (China)
Qingsong Wang, Sun Yat-sen University (China)
Published in SPIE Proceedings Vol. 12248:
Second International Conference on Sensors and Information Technology (ICSI 2022)
Lijia Pan, Editor(s)
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