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Proceedings Paper

Fullerene tips for scanning probe microscopy
Author(s): Kevin F. Kelly; Dipankar Sarkar; Stephen J. Oldenburg; Gregory D. Hale; Naomi J. Halas
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Paper Abstract

We have succeeded in adsorbing individual C60 molecules onto the tunneling region of an STM tip. The individual tip- adsorbed molecules are imaged by scanning the fullerene- adsorbed tip over a defect covered graphite surface. The nanometer-size defects serve as a surface tip array which 'inverse images' the molecules adsorbed to the tip when the surface is scanned. These tips were subsequently used to observe threefold symmetric electron scattering from point defects on a graphite surface, an effect that could not be observed using bare metal tips. Functionalizing an STM tip with an appropriate molecule adsorbate alters the density of states near the Fermi level of the tip and changes its imaging characteristics.

Paper Details

Date Published: 16 December 1996
PDF: 9 pages
Proc. SPIE 2854, Fullerenes and Photonics III, (16 December 1996); doi: 10.1117/12.262973
Show Author Affiliations
Kevin F. Kelly, Rice Univ. (United States)
Dipankar Sarkar, Rice Univ. (United States)
Stephen J. Oldenburg, Rice Univ. (United States)
Gregory D. Hale, Rice Univ. (United States)
Naomi J. Halas, Rice Univ. (United States)


Published in SPIE Proceedings Vol. 2854:
Fullerenes and Photonics III
Zakya H. Kafafi, Editor(s)

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