Share Email Print

Proceedings Paper

Low-cost mask for excimer laser projection ablation
Author(s): James L. Speidell; Rajesh S. Patel; Steven A. Cordes
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Excimer laser projection ablation is a dry patterning process in which an intense beam of ultraviolet light from an excimer laser is used to directly pattern a material. This technique has been used extensively in the microelectronics industry for patterning both organic and inorganic materials. Excimer laser projection ablation requires the use of a mask which is similar to a conventional 1X photomask. The laser ablation mask must withstand significantly higher energy densities than conventional photolithographic masks. A dielectric mask structure which consists of a quartz substrate coated with a stack of dielectric thin films has been developed for this process. Although the dielectric mask has been used successfully in a manufacturing environment, it suffers from the disadvantages of a complex fabrication process and high cost. Alternatives to the dielectric mask have been explored and a new mask has been developed which consists of an aluminum film on a quartz substrate. This mask meets the requirements for the laser ablation process and has the advantage of a low cost fabrication process which is similar to conventional chrome on quartz photomasks. The mask development, specifications, fabrication and results are discussed.

Paper Details

Date Published: 27 December 1996
PDF: 12 pages
Proc. SPIE 2884, 16th Annual BACUS Symposium on Photomask Technology and Management, (27 December 1996); doi: 10.1117/12.262824
Show Author Affiliations
James L. Speidell, IBM Thomas J. Watson Research Ctr. (United States)
Rajesh S. Patel, IBM Microelectronics (United States)
Steven A. Cordes, IBM Thomas J. Watson Research Ctr. (United States)

Published in SPIE Proceedings Vol. 2884:
16th Annual BACUS Symposium on Photomask Technology and Management
Gilbert V. Shelden; James A. Reynolds, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?