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Proceedings Paper

Fiber optic low-coherence reflectometer for process control
Author(s): Paul H. Shelley; Simonida Rutar; Lloyd W. Burgess
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Paper Abstract

A fiber optic based optical low coherence reflectometer has been investigated for process monitoring applications that include its use with both transparent and highly scattering materials. This paper addresses instrumental issues and several applications including measurement of multiple layer polymer films, paint clear coat thickness and refractive index, highly scattering paint layer thickness, and particle size analysis in liquid suspensions.

Paper Details

Date Published: 10 December 1996
PDF: 10 pages
Proc. SPIE 2836, Chemical, Biochemical, and Environmental Fiber Sensors VIII, (10 December 1996); doi: 10.1117/12.260585
Show Author Affiliations
Paul H. Shelley, Univ. of Washington (United States)
Simonida Rutar, Univ. of Washington (United States)
Lloyd W. Burgess, Univ. of Washington (United States)

Published in SPIE Proceedings Vol. 2836:
Chemical, Biochemical, and Environmental Fiber Sensors VIII
Robert A. Lieberman, Editor(s)

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