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Proceedings Paper

In-situ surface monitoring system for synchrotron mirrors under high heat load
Author(s): Peter H. Mui; George Srajer; Dennis M. Mills
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Paper Abstract

A portable electro-optical system capable of real-time measurements of surface distortions down to 0.5 (mu) rad is described, limited primarily by the short-term system stability. Methods to reduce the system fluctuations and to enhance the detectable resolution are explained. Although designed for use with mirrors for synchrotron radiation sources, this system has the flexibility to be applied to other optical components. The prototype system has been tested on a sample mirror piece, and preliminary results are presented. A brief discussion about the extension of this metrology unit to adaptive optics is also given.

Paper Details

Date Published: 22 November 1996
PDF: 14 pages
Proc. SPIE 2856, Optics for High-Brightness Synchrotron Radiation Beamlines II, (22 November 1996); doi: 10.1117/12.259871
Show Author Affiliations
Peter H. Mui, Argonne National Lab. (United States)
George Srajer, Argonne National Lab. (United States)
Dennis M. Mills, Argonne National Lab. (United States)

Published in SPIE Proceedings Vol. 2856:
Optics for High-Brightness Synchrotron Radiation Beamlines II
Lonny E. Berman; John Arthur, Editor(s)

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