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Proceedings Paper

Status of the optical metrology at the ESRF
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Paper Abstract

Beamline optical components and their dynamic holding and bending systems are qualified at the ESRF in the optical metrology laboratory, which has been moved recently into the ESRF experimental hall. Software and hardware enhancements of the five instruments used to perform these ex situ characterizations are described. In situ beamline mirror metrology using a wavefront analyzer has been introduced in ID24 and ID20 beamlines. The design of the analyzer, its architecture with respect to the mirror chambers and its use in active optics control with mechanical and bimorph benders are described in this paper.

Paper Details

Date Published: 22 November 1996
PDF: 9 pages
Proc. SPIE 2856, Optics for High-Brightness Synchrotron Radiation Beamlines II, (22 November 1996); doi: 10.1117/12.259863
Show Author Affiliations
Olivier Hignette, European Synchrotron Radiation Facility (France)
Amparo Rommeveaux, European Synchrotron Radiation Facility (France)

Published in SPIE Proceedings Vol. 2856:
Optics for High-Brightness Synchrotron Radiation Beamlines II
Lonny E. Berman; John Arthur, Editor(s)

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