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Proceedings Paper

Dual-wavelength Sagnac-Michelson distributed optical fiber sensor
Author(s): Anatoli A. Chtcherbakov; Pieter L. Swart; Stephanus J. Spammer
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Paper Abstract

A novel interferometric technique is described to detect and locate perturbations along an optical fiber. This distributed sensor has a position dependent response to time-varying disturbances such as strain or temperature. These disturbances cause a phase shift which is detected and converted to spatial information. The sensor consists of a Sagnac interferometer merged with a Michelson interferometer. This is achieved by a frequency selective mirror in the center of the Sagnac-loop. The sensor is illuminated by two light sources with wavelengths lambda1 and lambda2, respectively. The mirror reflects lambda1 and transmits lambda2, therefore causing the interferometer to operate as a Michelson at wavelength lambda1 and as a Sagnac at wavelength (lambda) 2. Any time-varying perturbation on the fiber will result in a signal at lambda2 proportional to the product of the rate of phase change caused by the perturbation and the distance of the perturbation relative to the position of the mirror. The output of the Michelson interferometer at wavelength lambda1 is proportional to the phase change caused by the unknown perturbation. By dividing the output of the Sagnac interferometer by the time rate of change of the Michelson interferometer signal, the position of the disturbance relative to the mirror is located. Results obtained with a 200 m distributed fiber sensor are discussed.

Paper Details

Date Published: 27 November 1996
PDF: 7 pages
Proc. SPIE 2838, Distributed and Multiplexed Fiber Optic Sensors VI, (27 November 1996); doi: 10.1117/12.259812
Show Author Affiliations
Anatoli A. Chtcherbakov, Rand Afrikaans Univ. (South Africa)
Pieter L. Swart, Rand Afrikaans Univ. (South Africa)
Stephanus J. Spammer, Univ. of Pretoria (South Africa)

Published in SPIE Proceedings Vol. 2838:
Distributed and Multiplexed Fiber Optic Sensors VI
Alan D. Kersey; John P. Dakin, Editor(s)

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