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Proceedings Paper

High-speed asynchronous data mulitiplexer/demultiplexer for high-density digital recorders
Author(s): Albert Berdugo; Martin B. Small
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Paper Abstract

Modern High Density Digital Recorders are ideal devices for the storage of large amounts of digital and/or wideband analog data. Ruggedized versions of these recorders are currently available and are supporting many military and commercial flight test applications. However, in certain cases, the storage format becomes very critical, e.g., when a large number of data types are involved, or when channel- to-channel correlation is critical, or when the original data source must be accurately recreated during post mission analysis. A properly designed storage format will not only preserve data quality, but will yield the maximum storage capacity and record time for any given recorder family or data type. This paper describes a multiplex/demultiplex technique that formats multiple high speed data sources into a single, common format for recording. The method is compatible with many popular commercial recorder standards such as DCRsi, VLDS, and DLT. Types of input data typically include PCM, wideband analog data, video, aircraft data buses, avionics, voice, time code, and many others. The described method preserves tight data correlation with minimal data overhead. The described technique supports full reconstruction of the original input signals during data playback. Output data correlation across channels is preserved for all types of data inputs. Simultaneous real- time data recording and reconstruction are also supported.

Paper Details

Date Published: 21 November 1996
PDF: 8 pages
Proc. SPIE 2829, Airborne Reconnaissance XX, (21 November 1996); doi: 10.1117/12.259749
Show Author Affiliations
Albert Berdugo, Aydin Vector Division (United States)
Martin B. Small, Calculex, Inc. (United States)

Published in SPIE Proceedings Vol. 2829:
Airborne Reconnaissance XX
Richard J. Wollensak; Wallace G. Fishell; William H. Barnes; Arthur A. Andraitis; Alfred C. Crane Jr.; Michael S. Fagan, Editor(s)

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