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Proceedings Paper

Computer-enhanced photon tunneling microscopy for composite materials characterization and durability assessment
Author(s): James D. Kleinmeyer
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Paper Abstract

In an effort to reduce cost and maximize the utility of each test specimen, our laboratory has incorporated several types of non-intrusive techniques for surface analysis and sample characterization. The newest and one of the most promising techniques is computer enhanced photon tunneling microscopy. This paper describes our current photon tunneling microscopy system and its use in the characterization of polymer matrix composite materials surfaces. The technique of photon tunneling microscopy was first made available commercially through a licensee of the Polaroid Corporation in 1992. Our system was purchased in 1994 and has been used primarily to study the effects of accelerated aging on composite materials.

Paper Details

Date Published: 15 November 1996
PDF: 8 pages
Proc. SPIE 2948, Nondestructive Evaluation for Process Control in Manufacturing, (15 November 1996); doi: 10.1117/12.259211
Show Author Affiliations
James D. Kleinmeyer, Army Research Lab. (United States)

Published in SPIE Proceedings Vol. 2948:
Nondestructive Evaluation for Process Control in Manufacturing
Richard H. Bossi; Tom Moran, Editor(s)

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