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Proceedings Paper

Surface thermal lensing technique: a novel tool for studying contamination effects on optical components
Author(s): Rene Krupka; Zhouling Wu
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Paper Abstract

Contamination-induced degradation of optics often leads to enhanced absorption, which presents a serious limit for many important applications, especially those associated with high power laser systems and/or large aperture components. For this reason many different techniques were developed during the last decade for weak absorption studies, which include laser calorimetry, photoacoustic spectroscopy, as well as various photothermal techniques. In this paper recent progress is presented for the surface thermal lensing (STL) technique, a novel photothermal method which is demonstrated to be an ultra-sensitive tool for monitoring contamination effects on optical components. Compared with the various conventional photothermal methods, such as the photothermal deflection technique, STL drastically reduces the experimental complexity but retains the advantages of being sensitive, accurate and non-contact, and capable of in-situ monitoring of optical absorption down to the sub-ppm level. Experimental data with emphasis on absorption measurements and contamination studies of optical thin films are presented.

Paper Details

Date Published: 11 November 1996
PDF: 7 pages
Proc. SPIE 2864, Optical System Contamination V, and Stray Light and System Optimization, (11 November 1996); doi: 10.1117/12.258320
Show Author Affiliations
Rene Krupka, Eastern Michigan Univ. (United States)
Zhouling Wu, Eastern Michigan Univ. (United States)

Published in SPIE Proceedings Vol. 2864:
Optical System Contamination V, and Stray Light and System Optimization
Robert P. Breault; A. Peter M. Glassford; Stephen M. Pompea; Robert P. Breault; Stephen M. Pompea, Editor(s)

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