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Proceedings Paper

Quartz crystal microbalance (QCM) flight measurements of contamination on the MSX satellite
Author(s): Bob E. Wood; David F. Hall; Jeffrey C. Lesho; James S. Dyer; O. Manuel Uy; William T. Bertrand
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Paper Abstract

The midcourse space experiment (MSX) satellite was launched into a 903 Km, 99.4-deg orbit April 24, 1996. It carries imaging spectrometers and radiometers that operate in the UV, visible, and infrared spectral ranges. In addition, it carries several contamination measuring instruments that are being used to characterize the contamination environment on, in, and around the satellite. Five are quartz crystal microbalances (QCMs), four of which are temperature- controlled (TQCMs). They are located on various external surfaces of the spacecraft and are operating at minus 40 degrees Celsius to minus 50 degrees Celsius to measure the condensation of silicone and organic molecules. One is a cryogenic quartz crystal microbalance (CQCM) which is located adjacent to the SPIRIT III infrared cryogenic telescope primary mirror. Its temperature followed the mirror which cooled from 28 to 20 K during the first week of operation. All QCMs recorded deposition in the 10 - 20 ng/cm$2)-day (1-2 angstrom/day) range. Thermo-gravimetric analyses on the QCMs provided insight into the amount and species of contaminants condensed. Data from the QCMs and other instruments in the contamination experiment (CE) suite played an important role in determining when it was safe to open covers on some of the optical instruments.

Paper Details

Date Published: 11 November 1996
PDF: 8 pages
Proc. SPIE 2864, Optical System Contamination V, and Stray Light and System Optimization, (11 November 1996); doi: 10.1117/12.258309
Show Author Affiliations
Bob E. Wood, Sverdrup Technology, Inc. (United States)
David F. Hall, The Aerospace Corp. (United States)
Jeffrey C. Lesho, Johns Hopkins Univ. (United States)
James S. Dyer, Utah State Univ. (United States)
O. Manuel Uy, Johns Hopkins Univ. (United States)
William T. Bertrand, Sverdrup Technology, Inc. (United States)

Published in SPIE Proceedings Vol. 2864:
Optical System Contamination V, and Stray Light and System Optimization
Robert P. Breault; A. Peter M. Glassford; Stephen M. Pompea; Robert P. Breault; Stephen M. Pompea, Editor(s)

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