Share Email Print

Proceedings Paper

Detection of a random edge and its application to interior surface measurement
Author(s): Zhige Zhang; Peter John Bryanston-Cross
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A random edge is the center of an in-focus-strip which is formed by viewing a vertical surface through a conventional microscope. The in-focus-strip is the image of the surface which locates inside the depth of the field of the microscope. The image of the surface which locates outside of the depth of the field is blurred and contains only low frequency illumination profile. The location of this random edge has been used to make internal measurements within holes as small as 200 microns in diameter. A specialized edge detector has been designed to 'find' the center within the in-focused region. The detector first locates the in- focus-strip. It then extracts the surface background detail from the out-of-focus part of the image. This out-of-focus information is used to effectively normalize the intensity distribution over the image. The image is then smoothed to remove random noise. The location of the center of the in- focus-strip is then found from the application of a weighting function constructed from the position of individual details located within the edge region. This method has been used in measuring inside a 0.25 mm diameter hole. The hole is used to carry the coolant through a turbine blade. The accuracy of the measurement is better then +/- micrometers .

Paper Details

Date Published: 14 November 1996
PDF: 9 pages
Proc. SPIE 2847, Applications of Digital Image Processing XIX, (14 November 1996); doi: 10.1117/12.258227
Show Author Affiliations
Zhige Zhang, Univ. of Warwick (United Kingdom)
Peter John Bryanston-Cross, Univ. of Warwick (United Kingdom)

Published in SPIE Proceedings Vol. 2847:
Applications of Digital Image Processing XIX
Andrew G. Tescher, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?