
Proceedings Paper
System for characterizing small fibersFormat | Member Price | Non-Member Price |
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Paper Abstract
A system for 3D gauging of small fibers has been developed for process monitoring. The basic hardware consists of a pair of 2048 linear cameras orthogonally positioned, an IBM PC-compatible Pentium computer with frame grabber, a stepper motor and associated hardware for translating the fiber, a bright-field light source and special optics. The fiber is moved vertically past the two cameras as they scan. the computer acquires each scan line, processes it and then issues control signals to the stepper motor. Several different image processing operations are used to minimize the effects of illumination nonuniformity since fibers will sometimes have low contrast due to their small size. There are two sources of illumination variations, spatial and temporal which are processed independently. Image analysis is performed to provide 3D fiber shape characteristics.
Paper Details
Date Published: 31 October 1996
PDF: 6 pages
Proc. SPIE 2908, Machine Vision Applications, Architectures, and Systems Integration V, (31 October 1996); doi: 10.1117/12.257250
Published in SPIE Proceedings Vol. 2908:
Machine Vision Applications, Architectures, and Systems Integration V
Susan Snell Solomon; Bruce G. Batchelor; Frederick M. Waltz, Editor(s)
PDF: 6 pages
Proc. SPIE 2908, Machine Vision Applications, Architectures, and Systems Integration V, (31 October 1996); doi: 10.1117/12.257250
Show Author Affiliations
John W. V. Miller, Edison Industrial Systems Ctr. (United States)
Timothy A. Kohler, Edison Industrial Systems Ctr. (United States)
Timothy A. Kohler, Edison Industrial Systems Ctr. (United States)
Jaroslaw P. Sacha, Edison Industrial Systems Ctr. (United States)
Behrouz N. Shabestari, Edison Industrial Systems Ctr. (United States)
Behrouz N. Shabestari, Edison Industrial Systems Ctr. (United States)
Published in SPIE Proceedings Vol. 2908:
Machine Vision Applications, Architectures, and Systems Integration V
Susan Snell Solomon; Bruce G. Batchelor; Frederick M. Waltz, Editor(s)
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