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Proceedings Paper

Calibration methods and results for the Advanced Solid-State Array Spectroradiometer (ASAS)
Author(s): Phillip W. Dabney; Michael R. Tierney; James R. Irons; William M. Kovalick; Michael J. C. Bur; Carol A. Russell
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Paper Abstract

Improved methods for calibrating and characterizing the CCD array based off-nadir tiltable advanced solid-state array spectroradiometer (ASAS) were developed and applied. Sensor characteristics such as radiometric sensitivity, polarization sensitivity, signal-to-noise ratio, temperature sensitivity, spectral bandpass, spectral distortion, and spatial resolution were measured. Radiometric sensitivity, array temperature sensitivity, and signal-to-noise were measured using a barium sulfate coated integrating hemisphere whose output calibration is traceable to NIST. Polarization sensitivity was measured for 62 spectral bands across all 512 spatial pixels (31 K pixels). Spectral bandpass and spectral distortion were measured using a 0.5 meter doublepass monochromator. Spatial resolution (given as the modulation-transfer-function -- MTF) and distortion were measured using a combination of monochromatic collimated light to directly measure the point-spread-function (PSF) and the edge spread function (ESF) derived from actual image data. The MTF obtain using the two techniques are compared. Potential improvements to the test setups and methods are described.

Paper Details

Date Published: 4 November 1996
PDF: 10 pages
Proc. SPIE 2818, Multispectral Imaging for Terrestrial Applications, (4 November 1996); doi: 10.1117/12.256098
Show Author Affiliations
Phillip W. Dabney, NASA Goddard Space Flight Ctr. (United States)
Michael R. Tierney, NASA Goddard Space Flight Ctr. (United States)
James R. Irons, NASA Goddard Space Flight Ctr. (United States)
William M. Kovalick, Hughes STX (United States)
Michael J. C. Bur, Hughes STX (United States)
Carol A. Russell, Univ. of Maryland/College Park (United States)

Published in SPIE Proceedings Vol. 2818:
Multispectral Imaging for Terrestrial Applications
Brian Huberty; Joan B. Lurie; Jule A. Caylor; Pol Coppin; Pierre C. Robert, Editor(s)

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