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Proceedings Paper

Soft x-ray to FUV measurements of the grazing incidence BRDF for a selection of low-reflectance surfaces
Author(s): Michael L. Edgar; Scott L. Cully; Sharon R. Jelinsky; Patrick N. Jelinsky; Oswald H. W. Siegmund; John K. Warren
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Paper Abstract

On future astronomical instruments for the soft x-ray to FUV, stray light may be a significant cause of background events. Currently, we are engaged in an ongoing program to identify materials that are suitable for use as low- reflectance surfaces in space based instruments. As a result, we have measured the scattering performance in this spectral region, of wide a selection of low-reflectivity materials, produced with a range of processes. We present preliminary measurements of the absolute bidirectional reflectance distribution function (BRDF) for a selection of seven of these materials. Measurements were obtained at a five spectral lines, including strong geocoronal lines, over the wavelength range 44 to 1216 angstrom at near grazing incidence. We find that in most cases for constant incident and scatter angles, the total variation of BRDF with wavelength over this range is only a factor of order ten. We also find that although we have identified materials which in many instances have lower reflectances than bead blasted aluminum, it is still a good choice for most applications given its low cost and convenience.

Paper Details

Date Published: 31 October 1996
PDF: 12 pages
Proc. SPIE 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, (31 October 1996); doi: 10.1117/12.256005
Show Author Affiliations
Michael L. Edgar, Univ. of California/Berkeley (United States)
Scott L. Cully, Univ. of California/Berkeley (United States)
Sharon R. Jelinsky, Univ. of California/Berkeley (United States)
Patrick N. Jelinsky, Univ. of California/Berkeley (United States)
Oswald H. W. Siegmund, Univ. of California/Berkeley (United States)
John K. Warren, Univ. of California/Berkeley (United States)

Published in SPIE Proceedings Vol. 2808:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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