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Proceedings Paper

Performance of transmission filters for EUV and soft x-ray astronomy
Author(s): Marcos Bavdaz; Anthony J. Peacock; Roland H. den Hartog; Abel Poelaert; Peter J. Underwood; Veli-Pekka Viitanen; Detlef Fuchs; Peter Bulicke; Stefan Kraft; Frank Scholze; Gerhard Ulm; Annesley C. Wright
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Paper Abstract

Soft x-ray detectors for astronomical applications are often also sensitive to visible and UV photons. Filters of a new design have been developed, which could be used in future missions to suppress the flooding of x-ray detectors by low energy photons. Three series of filters are discussed: aluminum/silicon multilayers, Niobium and calcium/boron multilayers. The filters are typically 100 to 200 nm thick and reject the IR/visible/UV from 10-4 to 10-6. The transmission for soft x-rays is above 10% for wavelengths less than 30 nm, when combining the bandpasses of at least two filters. The optimum transmission band depends very much on the filter type. The IR/visible/UV has been measured using standard laboratory spectro- photometers while the x-ray transmission characteristics have been determined using synchrotron radiation.

Paper Details

Date Published: 31 October 1996
PDF: 12 pages
Proc. SPIE 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, (31 October 1996); doi: 10.1117/12.256004
Show Author Affiliations
Marcos Bavdaz, European Space Agency/ESTEC (Netherlands)
Anthony J. Peacock, European Space Agency/ESTEC (Netherlands)
Roland H. den Hartog, European Space Agency/ESTEC (Netherlands)
Abel Poelaert, European Space Agency/ESTEC (Netherlands)
Peter J. Underwood, European Space Agency/ESTEC (Netherlands)
Veli-Pekka Viitanen, Metorex International Oy (Finland)
Detlef Fuchs, Physikalisch-Technische Bundesanstalt (Germany)
Peter Bulicke, Physikalisch-Technische Bundesanstalt (Germany)
Stefan Kraft, Physikalisch-Technische Bundesanstalt (Germany)
Frank Scholze, Physikalisch-Technische Bundesanstalt (Germany)
Gerhard Ulm, Physikalisch-Technische Bundesanstalt (Germany)
Annesley C. Wright, MRIC Research (United Kingdom)

Published in SPIE Proceedings Vol. 2808:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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