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Proceedings Paper

Analysis of the systematic and random errors in the conical corneal null-screen topographer
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Paper Abstract

In this work we describe how to perform virtual experiments by deforming our ideal device with translations and rotations of each component, then we determine which are the minimal deformations that can be detected (sensibility) and how much does they affect the results of the measurement (sensitivity), a necessary endeavor since systematic errors due to misalignment of the components may lead to poor performance of optical systems, especially those used to measure optical components. The simulation of the passage of light is computed using a system of equations obtained from the vector reflection law.

Paper Details

Date Published: 1 April 2020
PDF: 8 pages
Proc. SPIE 11352, Optics and Photonics for Advanced Dimensional Metrology, 113521H (1 April 2020); doi: 10.1117/12.2556056
Show Author Affiliations
Andrés Peña-Conzuelo, Univ. Nacional Autónoma de México (Mexico)
Manuel Campos-García, Univ. Nacional Autónoma de México (Mexico)
Daniel Aguirre-Aguirre, Univ. Nacional Autónoma de México (Mexico)
Oliver Huerta-Carranza, Univ. Nacional Autónoma de México (Mexico)


Published in SPIE Proceedings Vol. 11352:
Optics and Photonics for Advanced Dimensional Metrology
Peter J. de Groot; Richard K. Leach; Pascal Picart, Editor(s)

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