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Proceedings Paper

Research on terahertz non-destructive testing technology for internal defects of insulation layer
Author(s): Yuan Hou; Jing Xue; Guo Qi; Zhenwei Zhang
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Paper Abstract

In this study, terahertz non-destructive testing technology was used to insulation materials. The terahertz wave nondestructive testing was carried out to test the thickness of the layer, the air hole in the insulation layer and the defect of adiabatic structure. The refraction and absorption coefficients of terahertz wave in asbestos-filled nitrile rubber, aramid fiber-filled ethylene propylene diene monomer(EPDM) and silica-filled polyurethane rubber were studied. Two terahertz wave scanning imaging results were compared. Terahertz wave has a good penetrating ability to the insulation material and can be used to test the insulation layer thickness. At the same time, quality defects such as stratification and porosity of samples with a thickness of 2 mm can be identified. It is proved that terahertz technology can be applied to the detection of insulation materials and internal defects.

Paper Details

Date Published: 12 March 2020
PDF: 9 pages
Proc. SPIE 11441, 2019 International Conference on Optical Instruments and Technology: IRMMW-THz Technologies and Applications, 114410M (12 March 2020); doi: 10.1117/12.2555164
Show Author Affiliations
Yuan Hou, Xi’an Aerospace Chemical Propulsion Co., Ltd. (China)
Jing Xue, Xi’an Aerospace Chemical Propulsion Co., Ltd. (China)
Guo Qi, Xi`an Aerospace Chemical Propulsion Co., Ltd (China)
Zhenwei Zhang, Capital Normal Univ. (China)


Published in SPIE Proceedings Vol. 11441:
2019 International Conference on Optical Instruments and Technology: IRMMW-THz Technologies and Applications
Cunlin Zhang; Xi-Cheng Zhang; Zhiming Huang, Editor(s)

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